| 摘要 |
PURPOSE:To provide an arrangement type probe which is reduced in the plane area of pin connectors and is suitable for size reduction by arranging at least one of the plural pin connectors on a plane varying in a depth direction from the other pin connector on the same plane. CONSTITUTION:This arrangement type probe is constituted by lining up piezoelectric element groups on a packing material 4 mounted on a base plate 3 and leading out respective electrodes zigzag by silver foil 5. A first flexible substrate 7 is deposited on the outside surface of this base plate 3 and has two rows of electrode lands. The four pin connectors 12 are installed in correspondence to the respective groups. Further, the pin connector 15 (ab) is installed on the front end side provided with the electrode land. This pin connector has input/output pins 13 (ab) and project from the plane (rear surface of the base plate 3) on which the pin connector 15 (ab) is disposed. The pin connectors 12 are placed three-dimensionally in the depth direction of the probe in such a manner, by which the plane area is reduced and the pin connectors are accommodated within the longitudinal direction of the piezoelectric element groups. |
