Diameter and profile pick-up (sensing device, probe)

摘要

The invention relates to a diameter and profile pick-up whose measuring device consists of a laser light source which emits a highly parallel, ribbonlike light beam of predetermined height and thickness of ribbon. A detector is aligned on the laser light source. An object to be measured (sample, test specimen) is located in the ribbonlike beam and partially shades (occludes) the latter. The remaining beam intensity is detected and assigned to the sample diameter or to its surface roughness. Apart from the specimen, the beam path possibly also includes windows, transparent to the laser light, of a possibly required, hermetically sealable processing room. Depending on the measurement task, the specimen is guided through the laser beam, or the measuring device is guided parallel to the axis of the specimen. The entire test stand is constructed from commercially available components.