发明名称 Method for manufacturing capacitor and MIS transistor.
摘要 <p>In a method for manufacturing a capacitor (C) having a lower electrode (8), an upper electrode (11A, 12A) and a dielectric layer (91, 92, 93) therebetween and a MIS transistor (Qn, QP) on the same semiconductor substrate (1), impurity ions are introduced by ion implantation into the upper electrode as well as a gate electrode of the MIS transistor. &lt;IMAGE&gt;</p>
申请公布号 EP0614218(A1) 申请公布日期 1994.09.07
申请号 EP19940301461 申请日期 1994.03.01
申请人 NEC CORPORATION 发明人 SAITOH, MEGUMI, C/O NEC CORPORATION
分类号 H01L27/04;H01L21/822;H01L21/8242;H01L27/06;(IPC1-7):H01L21/82;H01L21/320 主分类号 H01L27/04
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