发明名称 EMBEDED COMPONENT INSPECTION DEVICE
摘要 PURPOSE:To inspect and measure with remote control the state of flaws and thickness reduction generating on a tank by pressing an ultrasonic probe element with an electromagnet to the tank and escalate and descalate it along a rail in the tank together with a flatcar. CONSTITUTION:During inspecting the inner and outer surfaces of a tank 2, the electromagnet of a probe 4 is operated to move the probe 4 up and down along a rail 5 by pressing the ultrasonic probe to the tank 2 and detect flaws and thickness reduction generated on the tank 2. By repeating this operation, bolt holes 27 of flange 29 to fix a mount 12 to the tank 2 are replaced to move the rail 5 in turn and to scan on the inner and outer surfaces of the tank. By using the bolt holes 27 of the flange 29 of the tank 2, drilling of a new bolt hole 27 is not required and fine control setting in the circumferential direction of the tank 2 becomes possible. Therefore, inspection of fixed position at every inspection time, in other word, a specific position measurement is possible.
申请公布号 JPH06242283(A) 申请公布日期 1994.09.02
申请号 JP19930026354 申请日期 1993.02.16
申请人 TOSHIBA CORP 发明人 HANAWA JUN
分类号 G01N29/26;G21C17/003 主分类号 G01N29/26
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