| 摘要 |
PURPOSE:To effectively execute a self-check for a large scale LSI by dividing a function block into a control section and a data operation section, and controlling the control section on a test instruction issued from an instruction housing ROM. CONSTITUTION:When an address counter 6 is actuated by a self-test starting signal 16, three kinds of signals for a test instruction, data and an expected value are output through one address. Test data are input from a data housing ROM 4 into the operation section 2 of a function block 1 by a switch 13, and the test instruction is input from an instruction housing ROM into a control section 3. The output 15 of the test data arithmetically processed in the operation section 2 is compared with the output of an expected value housing ROM 7 by a comparative detector 8 and held in a detection result holding register 9 as the bivalent signal of test result. Whether LSI is normal or abnormal is judged by sending the logical sum of a plurality of registers 9 provided inside LSI outside LSI through a serial transfer line 10. |
