| 摘要 |
PURPOSE:To provide a semiconductor integrated circuit which can be tested through a high speed clock having a working level or a level higher than it even if using a comparatively inexpensive IC tester which can not supply the high speed clock, and to provide a test method using the above semiconductor integrated circuit. CONSTITUTION:An exclusive-OR gate 2 fetches the first test clock TCLK1 into the first input through the first test clock input pin P1, and the second test clock TCLK2 into the second input through the second test clock input pin P2, and outputs a high speed clock SCLK being its output to the A-input of a selector 3. The high speed clock being higher in frequency than the test clock is internally generated to actuate an inside circuit, and as the result, a semiconductor integrated circuit which can be tested clock frequency having a working level or a level higher than it even if using a comparatively inexpensive IC tester is obtained. |
