发明名称 Multi-pin stacked capacitor utilizing micro villus patterning in a container cell and method to fabricate same
摘要 The present invention provides production repeatable process to form polysilicon storage node structures using MVP technology. The storage node is formed over word lines beginning with a deposition and planarization of an insulator or composite insulator. A contact/container photo and etch creates a contact/container opening to provide access to the underlying active area either directly or through a conductive plug. After the contact/container opening is formed, an insitu doped polysilicon layer is deposited and planarized to completely fill contact/container opening while isolating adjacent storage nodes from one another. Next an oxide layer is deposited and is followed by deposition of HSG poly. Then a plasma poly etch of the HSG poly is performed that is followed by a plasma oxide etch. After these steps, a timed poly etch is performed long enough to sufficiently transfer an 'archipelago' pattern to storage node poly. Transferring of the 'archipelago' pattern to poly produces very thin poly villus bars (or pins) to form a multi-pin storage node poly structure of the present invention. Finally a cell dielectric is deposited over the storage node poly and is followed by a deposition of a conductive material to form the second capacitor electrode. Conventional process steps are preformed from this point on to complete the semiconductor device.
申请公布号 US5340763(A) 申请公布日期 1994.08.23
申请号 US19930017067 申请日期 1993.02.12
申请人 MICRON SEMICONDUCTOR, INC. 发明人 DENNISON, CHARLES H.
分类号 H01L21/28;H01L21/02;H01L21/768;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108;(IPC1-7):H01L21/70;H01L27/00 主分类号 H01L21/28
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