发明名称 INNER FACE INSPECTION SYSTEM FOR CIRCULAR CONTAINER
摘要 PURPOSE:To minimize occurrence of a defective container by detecting whether the container has a defect exceeding a normal defect level based on the image of the inner face of the individual circular container and stopping the container production line immediately upon detection of the defect exceeding the normal defect level. CONSTITUTION:A gray level image signal 23a in a window region is binarized using a normal threshold value for a detecting defective pixel, and the number (area value) of the defective pixel in each window region is compared with the threshold area value for deciding normal defect thus deciding whether a container is a normal defective container or not by means of a binarization circuit 24 for detecting normal defect. Furthermore, the image signal 23a is binarized using a binarization threshold value for detecting a heavily defective pixel having a higher or lower gray level than a normal defective image or higher the gray level difference with respect to the background, and the number of heavily defective pixels in each window region is compared with a threshold area value for deciding a heavy defect thus deciding whether a container is heavily defective container or not by means of a binarization circuit 25 for detecting the heavy defect. Container production line is stopped immediately upon provision of a heavy defect detection signal HDF.
申请公布号 JPH06235702(A) 申请公布日期 1994.08.23
申请号 JP19930023090 申请日期 1993.02.12
申请人 FUJI ELECTRIC CO LTD 发明人 TOYAMA KOICHI;YAMAMURA TATSUO
分类号 G01B11/30;G01N21/88;G01N21/90;G01N21/94;G01N21/954;G06T1/00;G06T7/00 主分类号 G01B11/30
代理机构 代理人
主权项
地址