发明名称 Short channel trenched DMOS transistor
摘要 A DMOS transistor having a trenched gate is formed in a substrate such that the P body region of the transistor may be formed heavier or deeper while still maintaining a "short" channel. This is accomplished by forming a portion of the N+ type source region within the P body region prior to forming the trench, followed by a second implantation and diffusion of a relatively shallow extension of the N+ source region formed overlying a part of the P body region. The increased depth or doping concentration of the P body region advantageously lowers the resistance of the P body region, while the short channel lowers the on-resistance of the transistor for improved performance.
申请公布号 US5341011(A) 申请公布日期 1994.08.23
申请号 US19930031798 申请日期 1993.03.15
申请人 SILICONIX INCORPORATED 发明人 HSHIEH, FWU-IUAN;CHANG, MIKE F.;YILMAZ, HAMZA
分类号 H01L21/336;H01L29/08;H01L29/10;H01L29/78;(IPC1-7):H01L29/10 主分类号 H01L21/336
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