发明名称 HIGH-VOLTAGE SEMICONDUCTOR DEVICE WITH WELL COMPENSATION LAYER
摘要 The high voltage semiconductor device has a high density narrow well layer to provide a high break down voltage and punch through voltage. The high voltage semiconductor device includes a substrate (10) of a first conduction type; a well region (12) of negative conduction polarity to a first conduction type, a first conduction type source region (19) and drain region (20) depositing on the well region (20), semiconductor regions (17,18) having a lower density than the source and the drain regions (19,20), and well compensating layers (15,16) of the same conduction type as the well region (12) but of a lower density than the well region.
申请公布号 KR940007660(B1) 申请公布日期 1994.08.22
申请号 KR19860010885 申请日期 1986.12.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YUN, JUNG - U;SON, HAE - YUN;KIM, TAE - CHAN
分类号 (IPC1-7):H01L29/784 主分类号 (IPC1-7):H01L29/784
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