发明名称 |
HIGH-VOLTAGE SEMICONDUCTOR DEVICE WITH WELL COMPENSATION LAYER |
摘要 |
The high voltage semiconductor device has a high density narrow well layer to provide a high break down voltage and punch through voltage. The high voltage semiconductor device includes a substrate (10) of a first conduction type; a well region (12) of negative conduction polarity to a first conduction type, a first conduction type source region (19) and drain region (20) depositing on the well region (20), semiconductor regions (17,18) having a lower density than the source and the drain regions (19,20), and well compensating layers (15,16) of the same conduction type as the well region (12) but of a lower density than the well region.
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申请公布号 |
KR940007660(B1) |
申请公布日期 |
1994.08.22 |
申请号 |
KR19860010885 |
申请日期 |
1986.12.18 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
YUN, JUNG - U;SON, HAE - YUN;KIM, TAE - CHAN |
分类号 |
(IPC1-7):H01L29/784 |
主分类号 |
(IPC1-7):H01L29/784 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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