发明名称 VERY ACCURATE AIR REFRACTOMETER
摘要 PURPOSE:To carry out high resolution interference fringe measurement, by realizing the interfefence between basic waves and second harmonics, utilizing a feature of a nonlinear crystal. CONSTITUTION:A laser beam 1 passes through a lens 2, is incident upon a nonlinear crystal 3, collimated by a lens 4 after second harmonics are generated, propagated in the air for interferometry, etc., passes through lens 7 and is incident upon a nonlinear crystal 8 after the polarization state of reflected light from a reflecting mirror 5 is adjusted by a wavelength plate 6, etc. The second harmonics travel as they are, but a part of basic waves are converted into second harmonics and interfere with the former second harmonics. The number of this interference fringes becomes about 4X10<-6> of the number of normal interference fringes owing to a single wavelength by second harmonics, because the fringes are generated only for a portion of the difference between basic waves and second harmonics in the dispersion characteristics of air as a medium, the number of interference fringes to be measured becomes extremely few, and the very accurate phase measurement of interference fringes can be carried out.
申请公布号 JPH06229922(A) 申请公布日期 1994.08.19
申请号 JP19930037529 申请日期 1993.02.02
申请人 AGENCY OF IND SCIENCE & TECHNOL 发明人 MATSUMOTO KOICHI
分类号 G01B9/02;G01N21/45;(IPC1-7):G01N21/45 主分类号 G01B9/02
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