FAILURE DETECTION FOR LOGICAL CIRCUIT,申请号JP19930018309-传众专利搜索

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发明名称	FAILURE DETECTION FOR LOGICAL CIRCUIT
摘要
申请公布号	JPH06230089(A)	申请公布日期	1994.08.19
申请号	JP19930018309	申请日期	1993.02.05
申请人	NEC IC MICROCOMPUT SYST LTD	发明人	TAKAHASHI MAKOTO
分类号	G01R31/317;(IPC1-7):G01R31/318	主分类号	G01R31/317
代理机构		代理人
主权项
地址

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