TESTING DEVICE FOR SEMICONDUCTOR INTEGRATED CIRCUIT,申请号JP19930016571-传众专利搜索

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发明名称	TESTING DEVICE FOR SEMICONDUCTOR INTEGRATED CIRCUIT
摘要
申请公布号	JPH06230077(A)	申请公布日期	1994.08.19
申请号	JP19930016571	申请日期	1993.02.03
申请人	SHARP CORP	发明人	ISHIDA AKITO
分类号	G01R31/28;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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