Circuit arrangement for evaluating reactances to be measured
摘要
This circuit arrangement consists of a reactance to be measured and a reference reactance, reactance to be measured and reference reactance being essentially exposed to identical environmental influences. To generate a linear and temperature-compensated output signal, a clock signal for driving a measuring circuit (Mi) containing the reactance to be measured (Xi) can be derived from a reference circuit (1) containing the reference reactance (Xref). <IMAGE>
申请公布号
DE4304061(A1)
申请公布日期
1994.08.18
申请号
DE19934304061
申请日期
1993.02.11
申请人
VDO ADOLF SCHINDLING AG, 60487 FRANKFURT, DE
发明人
SCHUELER, GERD, 5449 BADENHARD, DE;WIESE, PETER, 6000 FRANKFURT, DE