发明名称 Circuit arrangement for evaluating reactances to be measured
摘要 This circuit arrangement consists of a reactance to be measured and a reference reactance, reactance to be measured and reference reactance being essentially exposed to identical environmental influences. To generate a linear and temperature-compensated output signal, a clock signal for driving a measuring circuit (Mi) containing the reactance to be measured (Xi) can be derived from a reference circuit (1) containing the reference reactance (Xref). <IMAGE>
申请公布号 DE4304061(A1) 申请公布日期 1994.08.18
申请号 DE19934304061 申请日期 1993.02.11
申请人 VDO ADOLF SCHINDLING AG, 60487 FRANKFURT, DE 发明人 SCHUELER, GERD, 5449 BADENHARD, DE;WIESE, PETER, 6000 FRANKFURT, DE
分类号 G01D3/036;G01D5/20;G01R27/26;(IPC1-7):G01D3/04;G01B7/00;G01D1/10;G01D5/14;G01R17/00 主分类号 G01D3/036
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