发明名称 Thin film transistor with three dimensional multichannel structure
摘要 A thin film transistor gate structure with a three-dimensional multichannel structure is disclosed. The thin film transistor gate structure according to the present invention comprises source/drain electrodes formed so as to be spaced from and opposite to each other on a substrate; semiconductive layers, comprised of a plurality of sub-semiconductive layers, each formed in a row, each end of the sub-semiconductive layers being in ohmic-contact with the source/drain electrodes; gate insulating layers surrounding each of the semiconductive layers; and gate electrodes surrounding each of the gate insulating layers. Accordingly, the whole outerlayers of each sub-semiconductive layer surrounded by the gate electrodes serve as channel regions. As a result, the effective channel area increases, thereby improving the channel conductance and current driving ability.
申请公布号 US5338959(A) 申请公布日期 1994.08.16
申请号 US19930040016 申请日期 1993.03.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, WEONKEUN;KIM, CHULSOO;HAN, JEONGIN
分类号 H01L29/78;H01L21/336;H01L29/786;(IPC1-7):H01L29/78 主分类号 H01L29/78
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