发明名称 |
METHOD OF FABRICATING A SEMICONDUCTOR DEVICE |
摘要 |
The method for forming a capacitor with a simple process comprises the steps of: a) depositing the plate polysilicon layer on the oxide layer for the capacitor; b) forming the defected layer on the polysilicon layer by implanting the ion whose atomic weight is more than 70 with low energy and high density; and c) forming the capacitor electrode by patterning the plate with a polysilicon layer whose edge part on the active region is inclined at an angle of 20-40 degree.
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申请公布号 |
KR940007390(B1) |
申请公布日期 |
1994.08.16 |
申请号 |
KR19910014536 |
申请日期 |
1991.08.22 |
申请人 |
SANSUNG ELECTRONICS CO., LTD. |
发明人 |
YUN, SANG - HYON |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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