发明名称 TRENCH TYPE EPROM CELL AND FARICATING METHOD THEREOF
摘要 The method for increasing the integration ratio of the elements comprises the steps of: a) forming an N- layer (2) with low density and N+ layer (3) with high density for common source on the bottom face of a P type substrate (1); b) forming an N+ region (7) with high density for drain and a P+ region (6) with high density on the upper face of the substrate; c) forming a buried oxide layer (8) on the N+ region for drain; d) forming a trench (9) and the first insulation layer (10) on it; and e) forming a floating gate (11A), the second insulation layer (12) and a control gate (13) on the first insulation and the buried oxide layers. The channel region is formed on the substrate by the voltage of the control gate.
申请公布号 KR940007394(B1) 申请公布日期 1994.08.16
申请号 KR19910012954 申请日期 1991.07.27
申请人 HYUNDAI ELECTRONICS CO., LTD. 发明人 AN, BYONG - JIN;KIM, JONG - U
分类号 H01L27/04;H01L27/115;(IPC1-7):H01L27/115 主分类号 H01L27/04
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