发明名称 |
TRENCH TYPE EPROM CELL AND FARICATING METHOD THEREOF |
摘要 |
The method for increasing the integration ratio of the elements comprises the steps of: a) forming an N- layer (2) with low density and N+ layer (3) with high density for common source on the bottom face of a P type substrate (1); b) forming an N+ region (7) with high density for drain and a P+ region (6) with high density on the upper face of the substrate; c) forming a buried oxide layer (8) on the N+ region for drain; d) forming a trench (9) and the first insulation layer (10) on it; and e) forming a floating gate (11A), the second insulation layer (12) and a control gate (13) on the first insulation and the buried oxide layers. The channel region is formed on the substrate by the voltage of the control gate.
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申请公布号 |
KR940007394(B1) |
申请公布日期 |
1994.08.16 |
申请号 |
KR19910012954 |
申请日期 |
1991.07.27 |
申请人 |
HYUNDAI ELECTRONICS CO., LTD. |
发明人 |
AN, BYONG - JIN;KIM, JONG - U |
分类号 |
H01L27/04;H01L27/115;(IPC1-7):H01L27/115 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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