发明名称 JUDGING METHOD FOR MEMORY
摘要 PURPOSE:To easily generate A test pattern and to surely judge the success/ failure of a ROM by using a PN pattern provided with random ability for judging the success/failure of the ROM. CONSTITUTION:A CPU 1 reads the PN pattern from a ROM 2, which stores the random PN pattern as the test pattern, corresponding to a ROM (test program) 4, compares the read PN pattern with the PN pattern generated by a PN pattern generator 3 and checks the success/failure judgement of the ROM2 according to whether both of PN patterns are coincident or not. Afterwards, when a check object range exists, this operation is repeatedly performed but when the check object range does not exist, the check is finished. In this case, the CPU 1 reads data just for one byte, for example, according to the test program and compares the data read from the check object ROM 2 with the pattern (for one byte) generated by the PN pattern generator 3.
申请公布号 JPH06222947(A) 申请公布日期 1994.08.12
申请号 JP19930027467 申请日期 1993.01.22
申请人 MITSUBISHI ELECTRIC CORP 发明人 SUZUKI RYUICHIRO
分类号 G06F11/22 主分类号 G06F11/22
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