| 摘要 |
<p>PURPOSE:To reduce a fraction defective of a liquid crystal display element at the step of completion and to reduce a production cost by finding defective TFT array substrates having defects at the early step of production process by executing continuity inspections and short-circuit inspections at every production process of scanning lines and signal lines. CONSTITUTION:In a TFT array substrate 143, the scanning line 103 and the signal line 111 are connected with a common conductive part 141 composed of a first conductive part 107 and a second conductive part 113 via an electrical resistor composed of a semiconductor layer consisting of the same material as, for example, material used for a TFT element 121. Thus, when an inspection current is charged by applying a low voltage at both ends of the scanning line 103 or the signal line 111, the inspection current hardly flows through the electric resistor and the scanning line 103 and the signal line 111 are in the equivalent condition to being insulated. Consequently, the inspection of the scanning line 103 and the inspection of the signal line 111 can be executed respectively at respective production processes.</p> |
