发明名称 OVERFILLED RASTER SCANNING SYSTEM
摘要 PURPOSE: To profile the intensity of a light source again and to generate the profile whose intensity is uniform. CONSTITUTION: The respective segments 40a-40j of a binary diffraction optical lens(BDO) 40 converge and diverge equivalent energy bands 30a-30j in accordance with the intensity and the width of the bands and convert them into bands 50a-50j having the same width and same energy. The segments 42a-42j of BDO 42 make the received bands 30a-30j parallel. When the wide band is compressed into the narrower band, the intensity of the narrow band increases. When the narrower band is diverged to the larger band, the intensity of the wide band reduces and the profile whose intensity is uniform such as a profile 50 is generated. Since the widths and the energy of the bands in the profile 50 are kept constant, the intensity of all the bands becomes constant and the profile 50 has intensity uniform for the whole width of an optical beam.
申请公布号 JPH06214184(A) 申请公布日期 1994.08.05
申请号 JP19930289114 申请日期 1993.11.18
申请人 XEROX CORP 发明人 RATSUSERU BII ROOCHI;ERISU DEII HARISU
分类号 G02B26/12;G02B27/00;H04N1/113;(IPC1-7):G02B26/10;H04N1/04 主分类号 G02B26/12
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