发明名称 MANUFACTURE OF WAFER WITH SINGLE CRYSTAL SILICON CARBIDE LAYER
摘要 PURPOSE: To manufacture a wafer with a large surface area with a single-crystal SiC layer by carbonating an Si substrate before growing the single-crystal SiC on the Si substrate and then depositing a polycrystalline SiC layer on the single-crystal SiC layer and etching the Si substrate. CONSTITUTION: A single-crystal silicon substrate 1 is arranged in a substrate holder 2 and is heated in a chamber. The surface of the silicon substrate 1 is carbonated and a nucleus formation layer 3 is formed and then a single- crystal SiC layer 4 is deposited by hetero epitaxial growth. Then, a polycrystalline SiC layer 5 is deposited on the singlecrystal SiC layer 4. A composite of the single-crystal Si substrate 1 including the nucleus formation layer 3 and the single-crystal SiC layer 4 and the polycrystalline SiC layer 5 is cooled and the single-crystal Si layer 1 is eliminated by a wet, chemical means. The singlecrystal silicon carbide layer 6 is further grown on the first single-crystal silicon carbide layer 4, thus forming a composite of the polycrystalline silicon carbide layer 5, the first single-crystal silicon carbide layer 4, and the second single-crystal silicon carbide layer 6 with less defect.
申请公布号 JPH06216050(A) 申请公布日期 1994.08.05
申请号 JP19930280472 申请日期 1993.10.13
申请人 C S HARUPURAITAA & ZORAARUTEKUNOROJII GMBH 发明人 KURISUTOFU SHIYORUTSU;FURANTSU KEERU;TOOMASU BUEEBAA
分类号 C30B25/02;C30B29/36;H01L21/205;H01L21/36 主分类号 C30B25/02
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