PROGRAMMABLE LOGIC ARRAY AND ITS TEST METHOD,申请号JP19930005744-传众专利搜索

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发明名称	PROGRAMMABLE LOGIC ARRAY AND ITS TEST METHOD
摘要
申请公布号	JPH06216758(A)	申请公布日期	1994.08.05
申请号	JP19930005744	申请日期	1993.01.18
申请人	RICOH CO LTD	发明人	NAKAGAWA KATSUHIKO
分类号	G01R31/317;G01R31/28;H03K19/173;H03K19/177;(IPC1-7):H03K19/177;G01R31/318	主分类号	G01R31/317
代理机构		代理人
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