发明名称 |
Surface shape measurement device. |
摘要 |
<p>A surface shape measurement device for measuring a surface shape of a measurement subject. The device includes a scanner for scanning the surface of the measurement subject with a light point, a lens for focusing an image of the light point on the surface of the measurement subject and a slit plate arranged at a position of a focal plane of the light point and having a plurality of apertures on a locus of the image of the light point. The device further includes a photoelectric converter arranged at a position to receive the light passing through the aperture for converting the light into a pulse signal and a signal processing circuit connected to receive the pulse signal for determining a position of the light point on the surface of the measurement subject based on a time-point of generation of the pulse signal, whereby the surface shape of the measurement subject is measured based on the position determined by the signal processing circuit. <IMAGE></p> |
申请公布号 |
EP0608634(A2) |
申请公布日期 |
1994.08.03 |
申请号 |
EP19930310565 |
申请日期 |
1993.12.24 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
FUKAZAWA, CHIAKI, C/O INTELLECTUAL PROPERTY DIV. |
分类号 |
G01B11/24;(IPC1-7):G01B11/24 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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