发明名称 Thin-film transistor having source and drain electrodes insulated by an anodically oxidized film
摘要 A thin-film transistor panel comprises an insulative substrate, a plurality of thin-film transistor elements arranged at predetermined intervals on said substrate, and wirings electrically connecting the thin-film transistor elements characterized in that the thin-film transistor element comprises a gate electrode, a gate-insulating film, an i-type semiconductor layer to face the gate electrode through the gate insulating film therebetween, an n-type semiconductor layer, source and drain electrodes electrically connected the portions of the i-type semiconductor layer through the n-type semiconductor layer, and an anodically oxidized film located between the source and drain electrodes to electrically isolate, said source and drain electrodes.
申请公布号 US5334859(A) 申请公布日期 1994.08.02
申请号 US19920939458 申请日期 1992.09.02
申请人 CASIO COMPUTER CO., LTD. 发明人 MATSUDA, KUNIHIRO
分类号 G02F1/1345;G02F1/1362;G02F1/1368;H01L21/336;H01L21/60;H01L21/77;H01L21/84;H01L29/786;(IPC1-7):H01L29/04;H01L27/01 主分类号 G02F1/1345
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