发明名称 |
Semiconductor device with test-only contacts and method for making the same |
摘要 |
A semiconductor device has test-only contacts to reduce the size of the device and eliminate unnecessary external contacts. In one form of the invention, a semiconductor device (30) is provided with solder balls (26) which are electrically coupled to those portions of a semiconductor die (20) that are necessary for device operation. The device also includes test pads (32) formed on a package substrate (12) which are electrically coupled to those portions of the die which are necessary only for a manufacturer's testing purposes. In another form, a semiconductor device (10) includes external test-only solder balls along the periphery of the package substrate, for example solder balls between boundaries A and B. After testing is complete, the package substrate is excised along boundary A, thereby eliminating solder balls which are not needed by the device user. A combination of the two techniques may also be used.
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申请公布号 |
US5334857(A) |
申请公布日期 |
1994.08.02 |
申请号 |
US19920864246 |
申请日期 |
1992.04.06 |
申请人 |
MOTOROLA, INC. |
发明人 |
MENNITT, TIMOTHY J.;WARREN, JOHN P.;SLOAN, JAMES W. |
分类号 |
H01L21/66;G01R31/28;H01L23/055;H01L23/31;H01L23/498;H01L23/58;(IPC1-7):H01L23/02 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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