发明名称 Device for supplying thermal analysis measuring devices with material samples contained in holders
摘要 The sample changer (1) contains a sample plate (3) and a gripper (9) arranged fixed in position but movable vertically. Samples contained in holders (75) can be deposited in holder recesses (11) arranged in a ring on the sample plate (3). In order to transfer a sample into the oven (23), the desired sample is brought beneath the gripper (9) by rotating the sample plate (3), the gripper is lowered and the holder (75) is grasped with the gripper fingers (7) and lifted from the sample plate (3). The sample plate (3) is then rotated until the gap (13) has been placed under the gripper (9). The measurement position (29) actually lies directly below the gripper (9) in the oven (23). By lowering the gripper (9) down through the gap in the sample plate (3) the probe can now be rested on the measurement position (27) and released for the measurement by moving the claws of the gripper fingers (7) apart. <IMAGE>
申请公布号 CH684214(A5) 申请公布日期 1994.07.29
申请号 CH19920002521 申请日期 1992.08.12
申请人 METTLER-TOLEDO AG 发明人 LANG, KARL
分类号 G01N1/00;G01N25/48;G01N35/00;G01N35/02;(IPC1-7):G01N25/00 主分类号 G01N1/00
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