发明名称 |
MANUFACTURING METHOD OF THIN FILM TRANSISTOR |
摘要 |
The method is enable to make Al alloy taper shape by adjustment of etching quantity, and improves a productivity. The forming method of Al gate and oxidation layer includes an evaporation process in which an alloy is evaporated on a substrate to form a Al2O3 layer, a forming process, a photo resist pattern forming process on Al2O3, and Al alloy layer and a positive oxidation process. An Al alloy is selectively made from Al-Si, Al-Pd, Al-Ni, Al-ge, Al-w. A positive oxdation layer has a Sl alloy for positive SUS or Pt for negative. A current density is 0.5-5 mA/cm2 at current control process.
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申请公布号 |
KR940006703(B1) |
申请公布日期 |
1994.07.25 |
申请号 |
KR19910009886 |
申请日期 |
1991.06.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JANG, IN - SHIK;BAE, BYONG - SONG;KIM, NAM - DOK |
分类号 |
H01L23/52;H01L21/3205;H01L21/336;H01L29/40;H01L29/78;H01L29/786;(IPC1-7):H01L29/784 |
主分类号 |
H01L23/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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