发明名称 APPARATUS FOR MEASURING CRYSTAL GRAIN SIZE
摘要 PURPOSE:To provide an apparatus wherein an object, to be inspected, whose crystal grain size is larger than a sheet thickness can be measured quickly in a production line out of apparatuses wherein the crystal grain size is measured nondestructively by an ultrasonic method. CONSTITUTION:A probe 1 is formed to be of a convergence type, and the convergence diameter of ultrasonic pulses is made sufficiently narrower than a crystal grain size. An object 5 to be inspected is scanned fine by a scanning mechanism 2. A sound-velocity operation device 4 measures a longitudinal-wave sound velocity continuously, and a difference in the sound velocity by a crystal orientation is analyzed. Even when a horizontal distance is changed a little, the sound velocity can be measured. As a result, the object to be inspected can be measured accurately not only in a case where it stands still but also in a case where it is moved at high speed while it is being vibrated.
申请公布号 JPH06201659(A) 申请公布日期 1994.07.22
申请号 JP19930000892 申请日期 1993.01.07
申请人 NKK CORP 发明人 IIZUKA YUKIMICHI;YUASA DAIJIRO
分类号 G01N29/00 主分类号 G01N29/00
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