| 摘要 |
<p>The object of the invention is a method for detection of foreign matter contents in gas, in which method the gas is led to a flow channel (1), in which the gas is filtered and heated, whereafter the gas is led to the measuring cells (3). The invention is characterized in that for the analyzing of the gas is used at least one ionization cell and at least one semiconductor cell (3, 6) arranged in parallel or in sequence.</p> |
