Bypass-Abtastpfad und integrierte Schaltkreiseinrichtung mit mindestens einem solchen Bypass-Abtastpfad

摘要

A bypass scan path is formed of a scan path and a scan path selecting circuit. The scan path has its operation controlled with a control signal group including a strobe signal, an update signal, shift clock signals. The scan path selecting circuit has its operation controlled with a reset signal and the control signal group for the scan path, and requires no other control signals. The reset signal and the control signal group for the scan path can be generated by a test controller defined in the standard of the boundary scan test of the IEEE 1149.1.