发明名称 Thermal fixture for testing an integrated circuit
摘要 Apparatus for controlling the temperature of an integrated circuit. A thermally conductive block has a vacuum passage connected to a vacuum pump for clamping the block to the top of an integrated circuit housing without mechanical clamping structures. A closed fluid loop including a circulating pump, heater and chiller modulate the temperature of a fluid passing through the conductive block thereby to control its temperature and the temperature of the integrated circuit independently of any other integrated circuit.
申请公布号 US5331273(A) 申请公布日期 1994.07.19
申请号 US19920866920 申请日期 1992.04.10
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY 发明人 SCHNEIDER, WALTER T.
分类号 G01R1/04;(IPC1-7):G01R31/02;H01L23/44 主分类号 G01R1/04
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