摘要 |
PURPOSE:To allow even an unskilled operator to inspect a wiring pattern of the whole of a substrate simply at one time. CONSTITUTION:The apparatus is provided with a figure data converting means 11 for converting CAD data related to a wiring pattern of a substrate with a multilayer wiring to a specific format, a data preserving means 12 for classifying and preserving the converted data of the wiring pattern for each of a plurality of layers, and a net number adding means 13 which sequentially detects the presence/absence of the connection of the wiring pattern for each of all the layers to that of an upper and/or a lower layer, and adds a net number for every connected pattern. Moreover, the apparatus includes a net data extracting means 15 for extracting the connecting state of terminals constituting a circuit from database of the wiring pattern, a comparing means 18 for comparing the net data with a preliminarily formed net list, and an output means 19 for outputting the comparing result of the comparing means. |