发明名称 WRITING AND ERASING METHOD FOR SEMICONDUCTOR NONVOLATILE MEMORY DEVICE
摘要 <p>PURPOSE:To provide a writing and an erasing method by which a nonvolatile memory cell having excellent reliability and a long life can be obtained. CONSTITUTION:A source 3 and a substrate 1 are grounded, and a positive voltage with respect to the substrate 1 is so applied to a control gate as to generate an electric field of such a strength as required to produce a tunnel effect in an insulating film 6c and at the same time a positive voltage of the same degree as that is applied to a drain 2, and at that time electrons pass through an insulating film 6c on the source 3 side by the tunnel effect through the source 3 from the substrate 1 and are injected into a floating gate 5 to complete the writing. The control gate 7, the source 3 and the substrate 1 are grounded, and a positive voice with respect to the substrate 1 is so applied to the drain 2 as to generate an electric field of such a strength as required to produce a tunnel effect, and at that time electrons stored under the floating gate 5 (thickness directly under is 10 to 300Angstrom ) pass through the insulating films 6c on the drain 2 side from the floating gate 5 by the tunnel effect through the drain 2 and then are discharged into the substrate 1 to complete the erasing.</p>
申请公布号 JPH06196715(A) 申请公布日期 1994.07.15
申请号 JP19930238011 申请日期 1993.09.24
申请人 MITSUBISHI ELECTRIC CORP 发明人 MATSUO RYUICHI
分类号 G11C17/00;G11C16/02;G11C16/04;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L29/788 主分类号 G11C17/00
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