发明名称 KNOWLEDGE REFLECTION TYPE ABNORMALITY DIAGNOSTIC DEVICE
摘要 <p>PURPOSE:To improve the accuracy of diagnostic contents by updating the diagnostic rules of an abnormality diagnostic system by the comparison and evaluation of knowledge on design with the knowledge on even examples. CONSTITUTION:A data processing part 2 converts data gathered from a plant component equipment 1 into featured values and an abnormality diagnostic part 3 executes an abnormality diagnostic processing according to the diagnostic rules from the featured values to display on an interface part 4. When a data change event example 7 is inputted from the interface part 6 when a diagnosed result is different from an experience event example, a data comparison and evaluation part 9 compares and evaluates the event example diagnostic rules with the design diagnostic rules of a data base part 10 and generates the new diagnostic rules to display on the interface part 6 and to update at the same time.</p>
申请公布号 JPH06187158(A) 申请公布日期 1994.07.08
申请号 JP19920356323 申请日期 1992.12.21
申请人 MITSUBISHI ELECTRIC CORP 发明人 IKEDA IKUO
分类号 G01D21/00;G06F9/44;G06N5/04;(IPC1-7):G06F9/44 主分类号 G01D21/00
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