BUILT-IN TYPE RAM TEST CIRCUIT,申请号JP19920335899-传众专利搜索

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发明名称	BUILT-IN TYPE RAM TEST CIRCUIT
摘要
申请公布号	JPH06186304(A)	申请公布日期	1994.07.08
申请号	JP19920335899	申请日期	1992.12.16
申请人	NEC ENG LTD	发明人	KAWANO YOSHIHIKO
分类号	G01R31/28;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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