发明名称 SEMICONDUCTOR DEVICE AND ASSEMBLY METHOD THEREOF
摘要 PURPOSE:To lower a thermal resistance and to enhance the reliability of an element by a method wherein a substance whose thermal conductivity is excellent is liquefied and filled into a gap at the bonding face of an uneven metallized substrate to a semiconductor chip by utilizing a capillary phenomenon. CONSTITUTION:A groove part 3 for electrode isolation is formed in a metallized substrate 1 provided with an electrode pattern 4, an electrode pattern 5 for a semiconductor chip 2 is aligned with it, and a face-down bonding operation is performed. An insulating filler 6 is applied in advance to one part of the groove part at the outside of the semiconductor chip 2. The filler is melted by heating in the bonding operation, it is conveyed in the groove part due to a capillary phenomenon, and a thermal resistance between the semiconductor chip and the metallized substrate is reduced. Since the heat-dissipating property of the semiconductor chip is improved, the reliability of an element can be enhanced.
申请公布号 JPH06188328(A) 申请公布日期 1994.07.08
申请号 JP19920340029 申请日期 1992.12.21
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TAKAMORI AKIRA;OTA HIROYUKI;KAMIYAMA SATOSHI;BAN YUZABURO;ONAKA SEIJI
分类号 H01L21/52;H01L23/12;H01S5/00;H05K1/18;(IPC1-7):H01L23/12;H01S3/18 主分类号 H01L21/52
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