Method and apparatus for testing integrated circuits,申请号GB19940009164-传众专利搜索

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发明名称	Method and apparatus for testing integrated circuits
摘要
申请公布号	GB9409164(D0)	申请公布日期	1994.06.29
申请号	GB19940009164	申请日期	1994.05.09
申请人	FORD MOTOR COMPANY	发明人
分类号	G01M17/007;G01R27/02;G01R31/04;G01R31/28;G01R31/3167;G01R31/317	主分类号	G01M17/007
代理机构		代理人
主权项
地址

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