| 摘要 |
<p>A test circuit and test technique for scan testing integrated circuits (95) includes scan cells (100, 110, 120) or capture scan elements arranged in a pseudo master slave configuration. The testing technique utilizes first independent scan cell (100, 110, 120) as a master stage and a second independent scan cell (100, 110, 120) as a slave stage for propagating data through the IC. The test circuit and test techniques are highly advantageous because of minimal structural overhead. However, the scan cells (100, 110, 120) must be loaded twice to recover the test data because half the test data is lost when the data is propagated through the IC. The shift register inputs (109, 119, 199) of one scan cell (100, 110, 120) are generally coupled to shift register outputs (108, 118, 128) of other scan cells. Each scan cell (100, 110, 120) generally only includes one latch element (131).</p> |
