| 摘要 |
PURPOSE:To obtain accurate azimuth information of a crystal with a simple structure by irradiating a single crystal sample with an X-ray from a predetermined direction, and receiving a diffracted X-ray in a predetermined direction by an integral two-dimensional recorder to record it as a diffraction pattern. CONSTITUTION:A measuring apparatus comprises a predetermined intensity photographing function for vibration-photographing a single crystalline sample 1 on a cylindrical IP plate 3 of an integral two-dimensional recorder by holding an X-ray intensity to be radiated to the sample 1, and a variable intensity photographing function for vibration-photographing the sample 1 on the plate 3 while varying the intensity to be radiated to the sample 1 in response to a vibrating angle at the time of vibration photographing in a state that an installed position of the plate 3 is moved by a predetermined distance. After the sample 1 is irradiated with the X-ray, a surface irradiated with the X-ray is irradiated with an exciting light to emit accelerated phosphorescence a light from a latent image stored, thereby clarifying a diffraction pattern recorded as a latent image and knowing an intensity of the diffracted X-ray radiated by a measurement of a light emitting quantity. |
