| 摘要 |
PURPOSE:To provide a high sensitivity analysis method of very small amount sample using a secondary ion mass spectrometry and a regulation method for standard sample for quantifying analysis used for it. CONSTITUTION:A method of analyzing metal components included in a sample uses a secondary ion mass spectrometry in analyzing a solid sample including metals. The secondary ion mass spectrometry is constituted of a sample regulation process in which the metal included in the sample is dissolved in liquid, solidified again and the obtained solid is sintered to form metal oxide, metal silver powder is mixed and press to form a tablet, and a sample analysis process to analyze the sample regulated as above. The standard sample regulation method for the secondary ion mass spectrometry is to solidify the dissolved metal in the solution including the metal at a specific concentration, to sinter the obtained solid to make it to metal oxide, to mix metal silver powder in this metal oxide and to press for forming a tablet. |
