发明名称 AUXILIARY MATERIAL FOR FORMATION OF RESIST PATTERN
摘要 PURPOSE:To obtain an auxiliary material for formation of a resist pattern to form a water-soluble org. film which causes no intermixing in the interface with a photoresist layer by compounding a specified saccharide into the material. CONSTITUTION:This auxiliary material for formation of a resist pattern is used to form a water-soluble org. film which is to be removed after exposure on a photoresist layer. In this material, a saccharide of <=1500mol.wt. is compounded. As for the saccharide of <=1500mol.wt., monosaccharide and oligosaccharide are used. As for the monosaccharide, ketose such as glyceraldehyde and erythorose is used, and as for oligosaccharide, malto- oligosaccharide, isomalto-oligosaccharide, etc., is used. The water-soluble org. film is, for example, a water-soluble interlayer 6 to be formed between a contrast enhancing photodecoloring org. film 7 and a photoresist layer 2, or a water-soluble antireflection layer. In this method, the saccharide of <=1500mol.wt. is preferably included by 1-20wt.% in the water-soluble org. films.
申请公布号 JPH06175371(A) 申请公布日期 1994.06.24
申请号 JP19920345381 申请日期 1992.12.01
申请人 SHIN ETSU CHEM CO LTD 发明人 WATANABE SATOSHI;HATAKEYAMA JUN;OKAZAKI SATOSHI;UMEMURA MITSUO;ISHIHARA TOSHINOBU
分类号 G03F7/26;H01L21/027;H01L21/30;(IPC1-7):G03F7/26 主分类号 G03F7/26
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