发明名称 Mechanische Objektplatte, insbesondere für ein Tunneleffektmikroskop.
摘要 An improved mechanism for the coarse adjustment of a stage especially for a scanning tunneling microscope stage is described. The stage (13) is moved by forces transmitted through rigid wire springs (10, 64, 88) mounted on leaf spring (40, 60, 84) assemblies which transmit the motion from rigidly mounted micrometer adjusting devices (44, 52, 80). The coarse adjustment mechanism of the present invention provides improved performance over coarse adjustment mechanisms presently available for STM applications. The present invention replaces separate sets of leaf springs for X and Y motion with a single set of four wire springs. This simplifies the design and increases the rigidity and stability by reducing the mechanical path length from the solid base to the X-Y-Z stage (13). The screw mechanisms (44, 52, 80) are all directly connected to the rigid base. This is made possible by the additional pairs of wire springs connected from the X and Y screws to the stage. The following advantages are achieved first, since the screw mechanisms do not move with the stage (13), driving mechanisms such as motors and gears can be simply connected; and, second, the rigidity and stability are increased since the stage (13) position is referenced directly to the base through all three screws rather than through intermediate support structures.
申请公布号 DE69005689(T2) 申请公布日期 1994.06.23
申请号 DE1990605689T 申请日期 1990.04.23
申请人 INTERNATIONAL BUSINESS MACHINES CORP., ARMONK, N.Y. 发明人 MCCORD, MARK ARMSTRONG, MOHEGAN LAKE NEW YORK 10547
分类号 G01B7/34;F16M11/12;G01B21/00;G01N27/00;G01Q10/02;G01Q60/16;G12B5/00 主分类号 G01B7/34
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