发明名称 |
METHOD OF SHORTENING THE TEST TIME OF MEMORY DEVICE |
摘要 |
The method for reducing testing time of a memory device includes the steps of counting the number of error bits in a process of checking whether a memory pattern is normal; if the number of error bits is greater than the number of spare row/column bits, stopping a pattern checking procedure, thereby reducing the testing time of the memory device.
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申请公布号 |
KR940005700(B1) |
申请公布日期 |
1994.06.22 |
申请号 |
KR19910020641 |
申请日期 |
1991.11.19 |
申请人 |
HYUNDAI ELECTRONICS CO., LTD. |
发明人 |
LEE, CHANG - YOP;KIM, MU - SOP |
分类号 |
G11C29/00;(IPC1-7):G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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