Top load socket and carrier

摘要

A top-load test and burn-in socket, for use with IC devices having a plurality of contact terminals located in a predetermined pattern on a surface of said device, adapted for automation has a base supporting a plurality of contacts, a flexible film having a conductive wiring pattern formed thereon, and an elastomeric support having a size and shape to support said first set of conductive pads with the flexible film being folded about said elastomeric support. A movable cover and a pair of cams afford the retraction of springs which press the IC device against the film along opposite ends.