发明名称 High power laser beam sampler
摘要 A beam sampler comprises a substrate made of highly transparent fused silica or zinc selenide, both capable of sustaining high power laser beams. The substrate defines an outer surface through which the light beam being sampled propagates. A sinusoidal diffracting relief is etched on this outer surface directly into the light-propagating material of the substrate. When a light beam propagates through the outer surface of the substrate, the three-dimensional diffracting relief extracts from this light beam at least one pair of low power beam samples.
申请公布号 US5323267(A) 申请公布日期 1994.06.21
申请号 US19920815960 申请日期 1992.01.02
申请人 GENTEC INC. 发明人 GALARNEAU, PIERRE;LANGLOIS, PIERRE;BELANGER, MICHEL;FRECHETTE, JULIE;TRUDEAU, JEAN-MARIE;COTE, MARIE
分类号 G01J1/42;G02B5/18;G02B27/10;H01S3/00;(IPC1-7):G02B1/00 主分类号 G01J1/42
代理机构 代理人
主权项
地址