Test template for monitoring the pins of a multi-pin chip cirucit package

摘要

A module probe template comprises a substrate of electrically insulative material which possesses contact pads or lands which at least partially surround substrate apertures which match the pin pattern on a module to be tested. Pin shoulders make contact with the land portions in the vicinity of the apertures and a second portion of the conductive land pattern extends to the edge of the template so as to provide connections to wires which supply signals to test and/or control instrumentation. A layer of thin electrically insulative tape or other material is also preferably laid over the conductive paths with small apertures present in the insulative tape so as to provide (in one embodiment) access to the contact land near the pin holes. This test template apparatus thus makes it possible to control and/or monitor pins which are otherwise inaccessible except with much greater difficulty.