Secondary ion mass spectrometric analysis of metals and method of preparing standard sample therefor.

摘要

A method of analyzing a solid, metal-containing sample by secondary ion mass spectrometry for the determination of the concentration of the metal, wherein the sample is shaped into a disc and measured for the metal ion intensity of secondary ion mass spectrometry. The disc is prepared by a process including the steps of: (a) mixing the sample with a liquid to dissolve the metal; (b) separating the metal from the solution as solids to form a first solid mass containing the metal; (c) calcining the solid mass to convert the metal into an oxide and to obtain a second solid mass; (d) mixing the second solid mass with silver powder in an amount of 0.15-5 parts by weight per part by weight of the metal oxide to obtain a mixture having a particle size of not greater than 100 mu m; and (e) shaping the mixture into the disc. When the sample is a liquid, the steps (a) and (b) are omitted. This technique is applicable for the preparation of a standard sample having a known composition of metals used for constructing a calibration curve.