发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PURPOSE:To improve the heat resistance and the reliability of a barrier layer for preventing the reaction of wiring and solder which are used in a flip chip. CONSTITUTION:A gold pad 4 of a barrier pad 3 and a wiring contact 2 are separately arranged with a lateral distance l. When the distance l is adjusted, heat resistance equivalent to the value which is obtained when the thickness of the barrier pad 3 as barrier metal is large can be obtained. Since contact positions are shifted, reliability is not deteriorated by pin holes which are generated at the time of barrier pad formation, and by flaws and cracks caused by electric probe check.
申请公布号 JPH06168947(A) 申请公布日期 1994.06.14
申请号 JP19920319588 申请日期 1992.11.30
申请人 NEC CORP 发明人 OYAMA YASUO
分类号 H01L23/52;H01L21/3205;(IPC1-7):H01L21/320 主分类号 H01L23/52
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