DOT PATTERN INSPECTION DEVICE

摘要

PURPOSE:To provide the dot pattern inspection device which positions an image to be inspected by high-speed processing by using small-capacity memory. CONSTITUTION:A positioning mechanism which scans and selects an inspection object dot pattern position in a two-dimensional image obtained by picking up an image of an inspection object dot pattern display surface is equipped with an image projection data preparation part 1 which prepares image projection data by projecting density values of a two-dimensional image on a prescribed axis, a run-length data generation part 2 which prepares projection run-length data by replacing the image projection data for combined data of the magnitude with width of cumulative addition density value, and a projection run-length data matching pat 4 which scans the two-dimensional image on the dot pattern display surface to be inspected with reference projection run- length data and determines the position where the inspection object dot pattern is present.