发明名称 Selektives, epitaxiales Silizium für eine Innen/Außen-Basisverbindung
摘要 In a bipolar device, selective epitaxial silicon provides an improved intrinsic-extrinsic base line 34. A trench (29, Fig. 2 not shown) physically separates an intrinsic base portion 20 and extrinsic base portion 21. The trench includes sidewalls having a thin oxide layer formed thereon. The bottom of the trench is exposed during processing. A shallow link 34 between the intrinsic-extrinsic regions of a bipolar transistor base is formed by depositing a heavily boron doped layer of silicon on the exposed portion of the trench. During subsequent processing, including rapid thermal anneal, there is some boron out-diffusion which forms a shallow diffused intrinsic-extrinsic base link. <IMAGE>
申请公布号 DE4341177(A1) 申请公布日期 1994.06.09
申请号 DE19934341177 申请日期 1993.12.02
申请人 HEWLETT-PACKARD CO., PALO ALTO, CALIF. 发明人 VOOK, DIETRICH W., MENLO PARK, CALIF.;WANG, HSIN HUA, SAN JOSE, CALIF.
分类号 H01L29/73;H01L21/331;H01L29/10;(IPC1-7):H01L29/73 主分类号 H01L29/73
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