发明名称 |
Selektives, epitaxiales Silizium für eine Innen/Außen-Basisverbindung |
摘要 |
In a bipolar device, selective epitaxial silicon provides an improved intrinsic-extrinsic base line 34. A trench (29, Fig. 2 not shown) physically separates an intrinsic base portion 20 and extrinsic base portion 21. The trench includes sidewalls having a thin oxide layer formed thereon. The bottom of the trench is exposed during processing. A shallow link 34 between the intrinsic-extrinsic regions of a bipolar transistor base is formed by depositing a heavily boron doped layer of silicon on the exposed portion of the trench. During subsequent processing, including rapid thermal anneal, there is some boron out-diffusion which forms a shallow diffused intrinsic-extrinsic base link. <IMAGE>
|
申请公布号 |
DE4341177(A1) |
申请公布日期 |
1994.06.09 |
申请号 |
DE19934341177 |
申请日期 |
1993.12.02 |
申请人 |
HEWLETT-PACKARD CO., PALO ALTO, CALIF. |
发明人 |
VOOK, DIETRICH W., MENLO PARK, CALIF.;WANG, HSIN HUA, SAN JOSE, CALIF. |
分类号 |
H01L29/73;H01L21/331;H01L29/10;(IPC1-7):H01L29/73 |
主分类号 |
H01L29/73 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|